Browse Prior Art Database

Method and System for Monitoring Across-Die Variations in Chips Using In-Built Leakage Reduction Techniques

IP.com Disclosure Number: IPCOM000197639D
Publication Date: 2010-Jul-19

Publishing Venue

The IP.com Prior Art Database

Abstract

A method and system is disclosed for monitoring across-die variations in chips. The method and system exploits in-built leakage reduction techniques to estimate across-die variations through multiple IDDQ measurements.