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Method to Detect Unauthorized Reuse or Counterfeiting of Semiconductor Components Disclosure Number: IPCOM000239170D
Publication Date: 2014-Oct-19
Document File: 2 page(s) / 30K

Publishing Venue

The Prior Art Database


A method and system is disclosed to allow identification of conterfeit or illegally reused semiconductor components. This method uses fuses or other circuits in semiconductor circuits in the semiconductor product that are modifed at wafer and/or module test to identify a "good" part and are modified in the system before removal to identify scrape or authorized reuse.

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Method to Detect Unauthorized Reuse or Counterfeiting of Semiconductor Components

Illegal reuse of semiconductor components presents results in system functionality and system reliability issues. The "poisoned" Supply Line creates financial issues for suppliers of semiconductor components and systems that use them.

Figure 1 illustrates the process.

A fuse code is created indicating whether the product has been used or is "good" product. The code is put into each semiconductor part at the time of manufacture by blowing fuses or setting other unique identifiers. At card and/or system test, the code is read. If the code indicates a "new" or "has sufficient remaining POH (Power On Hours)" for use in the system build, system build continues. If the code is not present or does not indicate sufficient remaining POH for the application, build stops and the component is removed.

At system EOL (End of Life) or a designated system or card rework point, additional fuses are blown in each semiconductor part or other identifiers in product circuits are set that identify "do no use" or indicate the amount of usable POH remaining in the part. System and card applications only proceed if the part is newly tested with the appropriate code or has sufficient allowed reuse for the application.

Figure 1



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