Method to Detect Unauthorized Reuse or Counterfeiting of Semiconductor Components
Publication Date: 2014-Oct-19
The IP.com Prior Art Database
A method and system is disclosed to allow identification of conterfeit or illegally reused semiconductor components. This method uses fuses or other circuits in semiconductor circuits in the semiconductor product that are modifed at wafer and/or module test to identify a "good" part and are modified in the system before removal to identify scrape or authorized reuse.