Publication Date: 2015-Jun-02
The IP.com Prior Art Database
This disclosure provides an x-ray imager. The x-ray imager includes an x-ray source, a first scintillator, a second scintillator, and a complementary metal–oxide–semiconductor (CMOS) panel. The x-ray source emits x-rays of varying energy. The first scintillator selectively captures low-energy x-ray, while the second scintillator absorbs high-energy x-ray. The CMOS panel reads a first signal from a fast scintillator (i.e. the first scintillator) and then reads a second signal from the slow scintillator (i.e. the second scintillator).
The present invention relates generally to x-ray techniques, and more particularly to an x-ray imager requiring a single x-ray exposure for image acquisition.
Various x-ray imagers having different image capturing techniques are generally known in the art. A conventional technique uses an x-ray sensor that is divided into pixel blocks, each pixel block including multiple pixels. Each of the multiple pixels includes a scintillator layer, with each scintillator layer having different characteristics. Another conventional technique includes two types of photodiodes that are each sensitive to different wavelengths. However, using two photodiodes adds cost and presents implementation challenges.
Further, another conventional x-ray imager comprises an x ray source emitting low energy component as well as high energy component. The x-ray imager is provided with a processor adapted to process computed radiography and digital radiography images obtained in a single irradiation of a subject to obtain a third combined processed image.
Such conventional techniques require multiple image acquisitions of a subject, such as a patient, or another object being inspected. The multiple image acquisitions present challenge of image blurring due to subject movement between the low and high energy acquisitions. As a result, the conventional techniques are slow, inefficient and costly.
It would be desirable to have an efficient x-ray imager requiring a single x-ray exposure for image acquisition.
BRIEF DESCRIPTION OF DRAWINGS
Figure 1 is a schematic diagram of an x-ray imager according to present invention.
Figure 2 depicts a dual well architecture according to the present invention.
Figure 3 is a graph of signal vs. time according to the present invention.
This disclosure proposes an x-ray imager. The x-ray imager requires a single x-ray exposure for image acquisition.
Figure 1 is a schematic diagram of the x-ray imager according to present invention. The x-ray imager includes an x-ray source (not shown), a first scintillator, a second scintillator, and a Complementary metal–oxide–semiconductor (CMOS) panel.
The x-ray source (not shown) emits x-rays having varying energies. The x-rays are emitted over a broad energy distribution below an end point. The end point represents a highest threshold energy that can be emitted by the x-ray source.
In general, scintillators convert incoming x-rays into optical photons. The optical photons are subsequently detected by an array of photodiodes on the CMOS panel. The photodiodes convert the optical photons into electrical signals that are used to construct an image. In current embodiment, the x-ray imager has two scintillators. In some other embodiments, the x-...