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Publication Date: 2017-Jul-06
Document File: 3 page(s) / 879K

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The Prior Art Database


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Dan Garcia, Keysight Technologies, Inc.

Jason Swaim, Keysight Technologies, Inc.


A measurement probe detects signals on a device under test (DUT) and transmits those signals to a measurement instrument such as an oscilloscope. The probe makes direct contact with a DUT and can take a variety of forms. A typical high impedance differential probe consists of a probe head module connected to a probe tip. The probe tip contains two leads to acquire a pair of differential signals simultaneously from a DUT. In a conventional design, the two leads of a probe tip have standard linear form factor and are fixed in their positions. During measurement, the two leads are often molded manually by a tweezer to access the contact points on a DUT. Therefore, the test leads are often deformed after use and rendered non-reusable. Additionally, the tips are extremely fine and not suitable for general purpose probing such as wafer pads. For such measurement, special pockets must be etched on the wafer pad to provide contact points for probing.


            The present disclosure provides an alternative design of a high impedance differential probe tip with adjustable width span. Two tipswith integrated spring-loaded pogo pins are connected to the probe head via sockets. Figure 1 shows an example of the probe tip 10 design.The tip 10 consists of a proximal portion 12 with a base 11 that is configured to be compatible with the socket attachment to the probe head.  At the end of the proximal portion 12 bends 13 downward at an angle to form a distal portion 14 which protrudes towards the edge, forming the tip 15. The form factor of the two portions joined at an angle provide users visual to ensure the tips 15 are making contact accurately with the desired DUT surface while maintaining mechanical stability and robustness for the fine tips.

The tips are chemically etched to form its precise geometries and can accommodate probing o...