Month of September 2013 - Page Number 6

Showing 51 - 60 of 451 from September 2013
Browse Prior Art Database
  1. 51.
    Nachfolgend in Tabelle 1 aufgelistete Substanzen Nr. 1 bis Nr. 8 beinhalten eine Cyclohexyloxylfunktion als strukturgebendes Merkmal. In kosmetischen Zubereitungen werden die Substanzen in reiner oder isomerengemischter Form verwendet, um vorteilhafte kosmetische Produkteigenschaften an Haar und Haut zu erzielen....
    IPCOM000231109D | 2013-Sep-27
  2. 52.
    The invention proposes a technique for detection of low intensity corona discharge. Corona discharge is emitted during high electric field activity and partial discharge (PD). The high electric discharge and partial discharge (PD) in ionized air may occur in an internal structure of hollow blades, airfoils, nacelles...
    IPCOM000231108D | 2013-Sep-27
  3. 53.
    A variable pole setting mechanism is used to mechanically delay individual sub-mechanisms driven by a common shaft. A typical application of a variable pole setting mechanism is to delay individual poles of a circuit breaker driven by one common drive for each pole. General areas of application are medium voltage or...
    IPCOM000231107D | 2013-Sep-27
  4. 54.
    A fixture platform is part of the floor of a Gas Isolated Switchgear (GIS) container in order to allow the GIS to be assembled outside of the container in a faster and safer way.
    IPCOM000231106D | 2013-Sep-27
  5. 55.
    The solution is simply to only allow the pairing action when close proximity is detected for only a short period after powering on the headset. After that time period expires, proximity of the headset to near field devices only allow reconnection with already known devices but do not allow a new pairing.
    IPCOM000231105D | 2013-Sep-27
  6. 56.
    A method is disclosed for incorporating a Deep Trench (DT) Capacitor in Ultra-Thin-Body and BOX (UTBB)/ Extremely Thin Silicon-on-Insulator (ETSOI) process flow. The method includes localized oxidation to provide isolation to the DT.
    IPCOM000231104D | 2013-Sep-26
  7. 57.
    A method for feeding-in composition data from Energy Dispersive X-Ray Analysis (EDX) to an algorithm is disclosed. The algorithm determines the best match for the optical material properties to feed into a scatterometry model. Thereafter, the algorithm iterates until the measurements match to give a more precise...
    IPCOM000231103D | 2013-Sep-26
  8. 58.
    A method for automated large block placement on circuit layouts is disclosed. The method provides a logical and visually understandable macro placement in large block circuit designing by introducing anchor points that provide a reliable way to connect circuit components.
    IPCOM000231102D | 2013-Sep-26
  9. 59.
    Disclosed is a method to base the whole Bevel Edge plasma etching on how well centered the wafer is placed on the Reactive Ion Etching (RIE) tool, and ensure that the F5 measurement tool provides a reliable recipe with repeatable data back to the RIE tool, while simultaneously monitoring the wafer centrality on F5...
    IPCOM000231101D | 2013-Sep-26
  10. 60.
    Disclosed is a method for using x-ray fluoresence produced with e-beam. Critical Dimension Scanning Electron Microscope. (CD-SEM) is a metrology technique commonly used to provide critical dimension. When the e-beam energy is high enough to ionize element of interest, x-ray fluoresence characteristic of the...
    IPCOM000231100D | 2013-Sep-26